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Individualized FAC on bottom tab subassemblies to minimize adhesive gap between emitter and optics

: Sauer, S.; Müller, T.; Haag, S.; Beleke, A.; Zontar, D.; Baum, C.; Brecher, C.


Zediker, M.S. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
High-Power Diode Laser Technology XV : 30-31 January 2017, San Francisco, California, United States
Bellingham, WA: SPIE, 2017 (Proceedings of SPIE 10086)
ISBN: 978-1-5106-0613-5
ISBN: 978-1-5106-0614-2
Paper 100860U, 8 pp.
Conference "High-Power Diode Laser Technology" <15, 2017, San Francisco/Calif.>
Conference Paper
Fraunhofer IPT ()

High Power Diode Laser (HPDL) systems with short focal length fast-axis collimators (FAC) require submicron assembly precision. Conventional FAC-Lens assembly processes require adhesive gaps of 50 microns or more in order to compensate for component tolerances (e.g. deviation of back focal length) and previous assembly steps. In order to control volumetric shrinkage of fast-curing UV-adhesives shrinkage compensation is mandatory. The novel approach described in this paper aims to minimize the impact of volumetric shrinkage due to the adhesive gap between HPDL edge emitters and FAC-Lens. Firstly, the FAC is actively aligned to the edge emitter without adhesives or bottom tab. The relative position and orientation of FAC to emitter are measured and stored. Consecutively, an individual subassembly of FAC and bottom tab is assembled on Fraunhofer IPT's mounting station with a precision of +/- 1 micron. Translational and lateral offsets can be compensated, so that a narrow and uniform glue gap for the consecutive bonding process of bottom tab to heatsink applies (Figure 4). Accordingly, FAC and bottom tab are mounted to the heatsink without major shrinkage compensation. Fraunhofer IPT's department assembly of optical systems and automation has made several publications regarding active alignment of FAC lenses [SPIE LASE 8241-12], volumetric shrinkage compensation [SPIE LASE 9730-28] and FAC on bottom tab assembly [SPIE LASE 9727-31] in automated production environments. The approach described in this paper combines these and is the logical continuation of that work towards higher quality of HPDLs.