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Time-resolved microscopy of fs-laser-induced heat flows in glasses

: Bonse, Jörn; Seuthe, Thomas; Grehn, Moritz; Eberstein, Markus; Rosenfeld, Arkadi; Mermillod-Blondin, Alexandre


Applied physics. A 124 (2018), No.1, Art. 60, 6 pp.
ISSN: 0340-3793
ISSN: 0721-7250
ISSN: 0947-8396 (Print)
ISSN: 1432-0630 (Online)
Deutsche Forschungsgemeinschaft DFG
EB 248/4-2
Deutsche Forschungsgemeinschaft DFG
EI 110/30-2
Deutsche Forschungsgemeinschaft DFG
RO 2074/8-2
Deutsche Forschungsgemeinschaft DFG
ME 4427/1-1
Journal Article
Fraunhofer IKTS ()

Time-resolved phase-contrast microscopy is employed to visualize spatio-temporal thermal transients induced by tight focusing of a single Ti:sapphire fs-laser pulse into a solid dielectric sample. This method relies on the coupling of the refractive index change and the sample temperature through the thermo-optic coefficient dn/dT. The thermal transients are studied on a timescale ranging from 10 ns up to 0.1 ms after laser excitation. Beyond providing direct insights into the laser–matter interaction, analyzing the results obtained also enables quantifying the local thermal diffusivity of the sample on a micrometer scale. Studies conducted in different solid dielectrics, namely amorphous fused silica (a-SiO2), a commercial borosilicate glass (BO33, Schott), and a custom alkaline earth silicate glass (NaSi66), illustrate the applicability of this approach to the investigation of various glassy materials.