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Correlation study of different CDM testers and CC-TLP

: Weber, Johannes; Kaschani, Karim T.; Gieser, Horst; Wolf, Heinrich; Maurer, Linus; Famulok, Nicolai; Moser, Reinhard; Rajagopal, Krishna; Sellmayer, Michael; Sharma, Anmol; Tamm, Heiko


Institute of Electrical and Electronics Engineers -IEEE-; IEEE Electron Devices Society; IEEE Reliability Society; IEEE Electromagnetic Compatibility Society:
39th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017. Proceedings : Tucson, AZ, USA, September 10-14, 2017
Piscataway, NJ: IEEE, 2017
ISBN: 978-1-58537-293-5
ISBN: 978-1-5090-6499-1
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) <39, 2017, Tucson/Ariz.>
Conference Paper
Fraunhofer EMFT ()

This paper analyzes the correlation between test results of three different CDM testers and corresponding results of Capacitively Coupled Transmission Line Pulsing (CC-TLP). Furthermore, it discusses the significance of the current slew rate as an additional failure threshold and the reasons for a poor reproducibility of CDM failures.