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Pulsed laser beam identification of SEE-sensitive regions and observation of additional failure modes relevant for RHA in Digital Isolators

Presentation held at 5th Workshop on Laser Testing of Radiation Effects on Components and Systems, RADLAS 2017, October 9, 2017, Montpellier, France
Mapping of SEE-sensitive regions and locating of additional failure modes relevant for RHA in digital isolators
 
: Schmitz, Simone; Steffens, Michael; Metzger, Stefan; Wolf, Raphael; Beck, Peter; Wind, Michael; Poizat, Marc

:
presentation urn:nbn:de:0011-n-4769654 (1.2 MByte PDF)
MD5 Fingerprint: 5969b1c3a687962181cd4234d5149eb6
Created on: 16.12.2017


2017, 12 Folien
Workshop on Laser Testing of Radiation Effects on Components and Systems (RADLAS) <5, 2017, Montpellier>
English
Presentation, Electronic Publication
Fraunhofer INT ()
pulsed laser mapping; laser SEE test

Abstract
A pulsed laser mapping of Digital Isolators was done. They were previously characterized with heavy ions at RADEF. During the test there was not only an identification of the regions which are sensitive to single-event effects (SEE) but it also revealed additional failure modes (i.e. high-frequency ringing and latchup) not seen during heavy ion testing. So this device was considered latchup free up to an LET of 60 MeV cm2/mg. But those effects could also be induced by highly penetrating particles and hence must be taken into account for radiation hardness assurance (RHA). In addition it was possible to measure the sensitive area for the different types of SEE at different laser energies.

: http://publica.fraunhofer.de/documents/N-476965.html