Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Influence of pulse duration and scanning direction on the deformation of edges during laser micro polishing

: Nüsser, Christian; Schneider, Simon

Fulltext (PDF; )

Wissenschaftliche Gesellschaft Lasertechnik -WLT-:
International Conference on Lasers in Manufacturing, LiM 2017 : Munich ICM, Internationales Congress Center München, Germany, June 26-29, 2017, CD-ROM
München: Wissenschaftliche Gesellschaft Lasertechnik e.V., 2017
10 pp.
International Conference on Lasers in Manufacturing (LiM) <2017, Munich>
World of Photonics Congress <2017, Munich>
Conference Paper, Electronic Publication
Fraunhofer ILT ()

Laser micro polishing with pulsed laser radiation has been investigated regarding the smoothing of surfaces. It is often described that this process influences the geometry of the surface less than conventional polishing techniques, which are often based on abrasive smoothing. But it is currently unknown how much the geometry of parts is influenced during laser micro polishing. The edges are of particular interest since they often determine the function of surfaces and it is known that they are significantly rounded during laser macro polishing with continuous wave laser radiation. Therefore, in this paper the influence of the pulse duration and the scanning direction on the deformation of edges during laser micro polishing is investigated. Milled test samples made of TiAl6V4 are used for the examinations. Three different pulse duration regimes (tP ≈ 200 ns, tP = 285-660 ns, tP = 1.22-1.60 μs) as well as three scanning directions are investigated. The analysis is performed with laser scanning microscopy for the geometry of the edges and white-light interferometry for the roughness of the surfaces. The results show that the pulse duration has minor influence and that the deformation of edges presumably depends more on the beam dimensions. Additionally, scanning of the surface in a meandering pattern perpendicular to the edge leads to less deformation than scanning parallel to the edge.