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Hier finden Sie wissenschaftliche Publikationen aus den FraunhoferInstituten. Dead time effects in the indirect timeofflight measurement with SPADs
 Abshire, Pamela (General Chair) ; Institute of Electrical and Electronics Engineers IEEE; IEEE Circuits and Systems Society: IEEE International Symposium on Circuits and Systems, ISCAS 2017. Proceedings : Baltimore, Md., USA, 2831 May 2017 Piscataway, NJ: IEEE, 2017 ISBN: 9781467368520 ISBN: 9781467368537 ISBN: 9781509014279 pp.505508 
 International Symposium on Circuits and Systems (ISCAS) <50, 2017, Baltimore/Md.> 

 English 
 Conference Paper 
 Fraunhofer IMS () 
 singlephoton avalanche diode (SPAD); dead time; TimeofFlight (ToF); range imaging; photon counting; pulsed light 
Abstract
Indirect timeofflight measurement with SPADs is performed by counting incident photons in several time windows. Since SPADs exhibit dead time not all incident photons can be counted within a given time window. This affects the expected values and, hence, the variance of the distance measurement. For photon detection rates close to the inverse of the dead time, which defines the maximum count rate of a SPAD, the probability of photon detection cannot be assumed constant within the window anymore. In this paper the effects of dead time on the photon counts are analyzed by employing statistical calculations. Based on these a model to correct such effects can be derived.