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Advanced condition monitoring system based on on-line semiconductor loss measurements

 
: Krone, T.; Hung, L.D.; Jung, M.; Mertens, A.

:

Institute of Electrical and Electronics Engineers -IEEE-:
ECCE 2016, IEEE Energy Conversion Congress & Expo : September 18-22, Milwaukee, WI; Proceedings
Piscataway, NJ: IEEE, 2016
ISBN: 978-1-5090-0737-0
ISBN: 978-1-5090-0738-7 (Print)
pp.1270-1277
Energy Conversion Congress & Expo (ECCE) <8, 2016, Milwaukee/Wis.>
English
Conference Paper
Fraunhofer IWES ()

Abstract
This paper presents an FPGA-based on-line condition monitoring system integrated at gate-driver voltage level. The system uses the change of on-state voltage and thermal resistance as ageing indicators. The monitoring is realized by implementing an on-line semiconductor power loss measurement system for switching and on-state losses and a thermal model of the module. Apart from the concept, its practical implementation is described, and the experimental results are given.

: http://publica.fraunhofer.de/documents/N-467501.html