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Microoptical artificial compound eyes: From design to experimental verification of two different concepts

 
: Duparre, J.; Wippermann, F.; Dannberg, P.; Schreiber, P.; Bräuer, A.; Völkel, R.; Scharf, T.

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Mazuray, L. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.; European Optical Society -EOS-:
Optical design and engineering II : 13 - 16 September 2005, Jena, Germany
Bellingham/Wash.: SPIE, 2005 (SPIE Proceedings Series 5962)
ISBN: 0-8194-5980-1
Paper 59622A (Vol.2)
Conference "Optical Design and Engineering" <2005, Jena>
English
Conference Paper
Fraunhofer IOF ()
artificial compound eye; compact vision system; insect vision; microoptic; microlens array

Abstract
Two novel objective types on the basis of artificial compound eyes are examined. Both imaging systems are well suited for fabrication using microoptics technology due to the small required lens sags. In the apposition optics a microlens array (MLA) and a photo detector array of different pitch in its focal plane are applied. The image reconstruction is based on moire? magnification. Several generations of demonstrators of this objective type are manufactured by photo lithographic processes. This includes a system with opaque walls between adjacent channels and an objective which is directly applied onto a CMOS detector array. The cluster eye approach, which is based on a mixture of superposition compound eyes and the vision system of jumping spiders, produces a regular image. Here, three microlens arrays of different pitch form arrays of Keplerian microtelescopes with tilted optical axes, including a field lens. The microlens arrays of this demonstrator are also fabricated using microoptics technology, aperture arrays are applied. Subsequently the lens arrays are stacked to the overall microoptical system on wafer scale. Both fabricated types of artificial compound eye imaging systems are experimentally characterized with respect to resolution, sensitivity and cross talk between adjacent channels. Captured images are presented.

: http://publica.fraunhofer.de/documents/N-45732.html