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A web based training system applied to the critical microelectronic design discipline electromagnetic compatibility (EMC)

: John, W.; Krahn, L.; Erdem, B.; Raeisi, M.; Bruning, R.


IEEE Electromagnetic Compatibility Society; International Union of Radio Science -URSI-, Commission Electronics and Photonics:
IEEE International Symposium on Electromagnetic Compatibility, EMC 2003. Symposium record. Vol.2 : 11 - 16 May 2003, Istanbul, Turkey
Piscataway, NJ: IEEE Service Center, 2003
ISBN: 0-7803-7779-6
International Symposium on Electromagnetic Compatibility (EMC) <2003, Istanbul>
Conference Paper
Fraunhofer IZM ()

Today, the design of IC, subsystems and systems dealing with electromagnetic problems (EMC) is often based on insufficient data and on assumptions of design constraints. The term EMC (electromagnetic compatibility) includes, as generally might be known, all actions intended to eliminate electromagnetic interference in electronic systems. Growing complexity, denser design and higher clock rates all lead to a substantial increase in EMC problems and design time. EMC is not commonly accepted in microelectronic design. Microelectronic designers have the opinion that EMC has to do with electrical and electronic systems and mandatory product regulations instead of requirements to the integrated circuit they are designing. Therefore, design under EMC-constraints is a big challenge and requires highly skilled engineers. The high processing speeds and integration densities lead to effects like reflections, crosstalk on transmission lines, delta-l-noise (ground bounce, simultaneous switching, current spike) as well as to electromagnetic radiation and irradiation, which have to be considered when applying microelectronic components. Due to the package complexity of systems and components not all EMC-effects can be observed during the development process by measurement. Furthermore, measurement techniques for EMC analysis are greatly limited by engineering and financial constraints. Besides, the consideration of international and national standards, of legal and company internal requirements, considering EMC-constraints in the development of electronic products becomes vital for quality and time to market. Due to the complexity of the basic physical theory and the transformation into design methods and tools there is a lack of practical training material, which is accepted by industry. In this contribution a problem specific net-based training system applied to signal integrity analysis on printed circuit boards is introduced and presented. The training system gains its particular relevance within the actual frame of life long learning (L3) initiatives. It is also pointed out that for employing new development strategies and environments most effectively and adequate training system can be introduced in parallel.