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Quantitative XPS imaging - new possibilities with the delay-line detector
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2005
Conference Paper
Titel
Quantitative XPS imaging - new possibilities with the delay-line detector
Author(s)
Vohrer, Uwe
Blomfield, C.
Page, S.
Roberts, A.
Hauptwerk
13th Applied Surface Analysis Workshop 2004
Konferenz
Applied Surface Analysis Workshop 2004
DOI
10.1016/j.apsusc.2005.01.114
Language
English
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Fraunhofer-Institut für Grenzflächen- und Bioverfahrenstechnik IGB