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Nanomaterials produced by laser ablation techniques. Part II: High spatially resolved nondestructive characterization of nanostructures

 
: Köhler, B.; Murray, P.; Shin, E.; Lipfert, S.; Schreiber, J.

:

Geer, R.E. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Testing, reliability, and application of micro- and nano-material systems IV : 28 February - 2 March 2006, San Diego, California, USA
Bellingham/Wash.: SPIE, 2006 (SPIE Proceedings Series 6175)
ISBN: 0-8194-6228-4
Paper 61750C, 9 pp.
Conference "Testing, Reliability, and Application of Micro- and Nano-Material Systems" <4, 2006, San Diego/Calif.>
English
Conference Paper
Fraunhofer IZFP, Institutsteil Dresden ( IKTS-MD) ()
nanoparticle; laser ablation; scanning electron microscopy; agglomeration; transmission electron microscopy

Abstract
We studied nanoparticles by several high resolution microscopic methods as scanning electron microscopy (SEM),
transmission electron microscopy (TEM) and scanning probe techniques especially atomic force microscopy (AFM) in
contact and non-contact mode. While AFM in non-contact mode gives reliable information for 100 nm range
nanoparticles it fails for smaller particles, showing lack of reproducibility. TEM and SEM prove to be reliable. By SEM
imaging the agglomeration behavior and the structure of agglomerates are discussed in detail.

: http://publica.fraunhofer.de/documents/N-45000.html