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 Günther, M. ; European Consortium for Mathematics in Industry ECMI: Progress in Industrial Mathematics at ECMI 2010 : The ECMI 2010, the 16th European Conference on Mathematics for Industry, was held in the historic city hall of Wuppertal in Germany, from July 26 to July 30, 2010 Berlin: Springer, 2012 (Mathematics in industry 17) ISBN: 9783642250996 (Print) ISBN: 3642250998 ISBN: 9783642251009 (Online) ISSN: 16123956 pp.187193 
 European Conference on Mathematics for Industry (ECMI) <16, 2010, Wuppertal> 

 English 
 Conference Paper 
 Fraunhofer ITWM () 
Abstract
The ongoing trend from micro to nanoelectronics causes the growth of the relative parameter variation during the integrated electronic circuits production resulting in a consequent reduction of the production yield. Thus, symbolic model order reduction (MOR) techniques which were developed for design and analysis of nominal systems have to be adapted to assist the design of circuits which are robust with respect to parameter variation. Therefore, new sensitivity based methods have to be introduced to estimate the output of statistical systems and to improve the performance of the statistical MOR methods.