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Using sensitivities for symbolic analysis and model order reduction of systems with parameter variation

: Salzig, C.; Hauser, M.; Venturi, A.


Günther, M. ; European Consortium for Mathematics in Industry -ECMI-:
Progress in Industrial Mathematics at ECMI 2010 : The ECMI 2010, the 16th European Conference on Mathematics for Industry, was held in the historic city hall of Wuppertal in Germany, from July 26 to July 30, 2010
Berlin: Springer, 2012 (Mathematics in industry 17)
ISBN: 978-3-642-25099-6 (Print)
ISBN: 3-642-25099-8
ISBN: 978-3-642-25100-9 (Online)
ISSN: 1612-3956
European Conference on Mathematics for Industry (ECMI) <16, 2010, Wuppertal>
Conference Paper
Fraunhofer ITWM ()

The ongoing trend from micro- to nanoelectronics causes the growth of the relative parameter variation during the integrated electronic circuits production resulting in a consequent reduction of the production yield. Thus, symbolic model order reduction (MOR) techniques which were developed for design and analysis of nominal systems have to be adapted to assist the design of circuits which are robust with respect to parameter variation. Therefore, new sensitivity based methods have to be introduced to estimate the output of statistical systems and to improve the performance of the statistical MOR methods.