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Shearlet-based reduced reference image quality assessment

 
: Bosse, S.; Chen, Q.; Siekmann, M.; Samek, W.; Wiegand, T.

:

Karam, L. ; Institute of Electrical and Electronics Engineers -IEEE-; IEEE Signal Processing Society:
IEEE International Conference on Image Processing, ICIP 2016. Proceedings : September 25-28, 2016, Phoenix Convention Center, Phoenix, Arizona, USA
Piscataway, NJ: IEEE, 2016
ISBN: 978-1-4673-9962-3 (Print)
ISBN: 978-1-4673-9961-6 (Online)
pp.2052-2056
International Conference on Image Processing (ICIP) <23, 2016, Phoenix/Ariz.>
English
Conference Paper
Fraunhofer HHI ()

Abstract
This paper proposes a reduced reference image quality assessment method using only a low number of features. It involves a shearlet decomposition, directional pooling of the obtained coefficient and extracts the scalewise statistical location parameter as a feature. The proposed method is tested and compared to similar approaches on the LIVE image database. On this database it outperforms the compared methods on five of seven distortion types and on the full testset with a linear correlation of = 0.89.

: http://publica.fraunhofer.de/documents/N-445127.html