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On-line semiconductor switching loss measurement system for an advanced condition monitoring concept

 
: Krone, T.; Hung, L.D.; Jung, M.; Mertens, A.

:

Institute of Electrical and Electronics Engineers -IEEE-:
EPE 2016, ECCE Europe, 18th European Conference on Power Electronics and Applications : Karlsruhe, Germany, 5 -9 September, 2016, USB-Stick
Piscataway, NJ: IEEE, 2016
ISBN: 978-90-75815-25-2
ISBN: 978-9-0758-1524-5
ISBN: 978-1-5090-1410-1
pp.2690-2699
European Conference on Power Electronics and Applications (EPE) <18, 2016, Karlsruhe>
English
Conference Paper
Fraunhofer IWES ()

Abstract
In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results.

: http://publica.fraunhofer.de/documents/N-445124.html