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Advanced metal contamination analysis for high efficiency solar cell manufacturing

: Meyer, S.; Wahl, S.; Hagendorf, C.

Fulltext (PDF; )

Energy Procedia 92 (2016), pp.369-373
ISSN: 1876-6102
International Conference on Crystalline Silicon Photovoltaics (SiliconPV) <6, 2016, Chambéry>
Journal Article, Conference Paper, Electronic Publication
Fraunhofer CSP ()

In view of the increasing importance of wafer surface purity for the manufacturing of high efficiency cells we present here a sensitive method for the quantitative determination of wafer surface contaminations. Our results show that the detection limits are sufficient for process control in solar cell manufacturing. Particularly, the analysis and recovery of Cu is regarded, which may - besides Fe - play an important role in the degradation of surface and interface quality of high efficiency solar cells.