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JS-002 module and product CDM result comparison to JEDEC and ESDA CDM methods

 
: Righter, A.; Ashton, R.; Carn, B.; Johnson, M.; Reynolds, B.; Smedes, T.; Ward, S.; Wolf, H.

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EOS/ESD Association Inc., Rome/N.Y.; Institute of Electrical and Electronics Engineers -IEEE-; IEEE Electron Devices Society:
38th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2016. Proceedings : Garden Grove, California, USA, 11-16 September 2016
Rome, NY: ESD Association, 2016
ISBN: 978-1-5853-7289-8
ISBN: 978-1-4673-8926-6
pp.135-141
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) <38, 2016, Garden Grove/Calif.>
English
Conference Paper
Fraunhofer EMFT ()

Abstract
CDM standard JS-002 is introduced, including the reasons for its development and the technical issues the new standard addresses. JS-002 is compared to the JEDEC JESD22-C101, ESDA and AEC Q100 CDM standards in terms of waveforms and integrated circuit pass/fail levels. JS-002 robustness levels are similar to JEDEC CDM levels.

: http://publica.fraunhofer.de/documents/N-434944.html