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New dicing and thinning concept improves mechanical reliability of ultra thin silicon

 
: Landesberger, C.; Klink, G.; Schwinn, R.; Aschenbrenner, R.

:

Morris, J.E. ; International Microelectronics and Packaging Society -IMAPS-:
International Symposium on Advanced Packaging Materials 2001. Proceedings : Processes, Properties and Interfaces : Chateau Elan, Braselton, Georgia, March 11 - 14, 2001
Washington, DC: IMAPS, 2001
ISBN: 0-930815-64-5
pp.92-97
International Symposium on Advanced Packaging Materials <7, 2001, Braselton/Ga.>
English
Conference Paper
Fraunhofer IZM ()
wafer thinning; fracture test; dicing; ultra thin chip

Abstract
Ultra thin silicon ICs with a remaining thickness of less than 30 µm are investigated with respect to their manufacturing technology and mechanical behavior. Thin wafers which were diced using a standard sawing process reveal low fracture resistance when a bending force is applied to single chips. To eliminate influence of micro-cracks induced by sawing extremely thin wafers, the new concept "Dicing by Thinning" was developed and is explained in the paper. The concept allows manufacturing of 10 - 30 µm thin wafers and includes self-acting die separation during thinning procedure. Best results are achieved when dicing lines between chips are prepared at front side of wafer by dry etching methods. First results of analysing mechanical reliability of thin silicon samples are presented and discussed.

: http://publica.fraunhofer.de/documents/N-4272.html