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Foreword to the special section on "Stress-Induced Phenomena in Microelectronics"

 
: Ho, Paul S.; Zschech, Ehrenfried

:

IEEE transactions on device and materials reliability 16 (2016), No.4, pp.439
ISSN: 1530-4388
ISSN: 1558-2574
International Workshop on Stress-Induced Phenomena in Microelectronics <2014, Austin/Tex.>
English
Abstract
Fraunhofer IKTS ()

Abstract
This special section contains papers from the international workshop on “Stress-Induced Phenomena in Microelectronics” held at the University of Texas at Austin on October 12–14, 2014.

: http://publica.fraunhofer.de/documents/N-426803.html