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Development and electrical characterization of a metal-ferroelectric-insulator semiconductor FET test structure

 
: Ali, Tarek
: Müller, Johannes; Lakner, Hubert; Heyns, Marc

:
Fulltext urn:nbn:de:0011-n-4259400 (8.6 MByte PDF)
MD5 Fingerprint: a31631b322be3aaa74edd38a6da69777
Created on: 10.12.2016


Dresden, 2016, XVI, 137 pp.
Dresden, TU, Master Thesis, 2016
English
Master Thesis, Electronic Publication
Fraunhofer IPMS ()

: http://publica.fraunhofer.de/documents/N-425940.html