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Leaky waveguides for low ҡ-measurement: From structure design to loss evaluation

: Wächter, C.; Rizzo, R.; Michelotti, F.; Munzert, P.; Danz, N.


Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Integrated Optics: Devices, Materials, and Technologies XX : San Francisco, California, 15 - 17 February 2016
Bellingham, WA: SPIE, 2016 (Proceedings of SPIE 9750)
Conference "Integrated Optics - Devices, Materials, and Technologies" <20, 2016, San Francisco/Calif.>
Conference Paper
Fraunhofer IOF ()

For high quality optical coatings the knowledge of the losses of the deposited materials is essential. A precise measurement of low Im(n+iκ)⤠10-6 at an intended operation wavelength and with low intensity can be achieved in waveguide configurations, whereby leaky waveguide configurations allow one to analyze losses of high- and low-index media of H-L-stacks as well due to resonances in the angle-dependent reflection curve. Numerical investigations reveal that different leaky wave schemes, e.g. Bragg-, Bloch- and Antiresonant-Reflecting waveguides, comply differently with practical requests. Loss figure evaluation requires peculiar attention due to measurement accuracy and ambiguities, thus suitable constraints for layer data and a proper merit-function construction have to be used.