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  4. Analytical elimination of substrate backside reflections from reflectance measurements
 
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2016
Journal Article
Title

Analytical elimination of substrate backside reflections from reflectance measurements

Abstract
An analytical approach to eliminate substrate backside reflections from measured reflectance of an unknown optical coating has been deducted. Thereby, measured transmittance, reflectance, and backside reflectance of the coating and transmittance and reflectance of the uncoated substrate at the desired angle of incidence and polarization state are required as input data. In the underlying theory, layer and substrate materials may be absorbing.
Author(s)
Wilbrandt, S.
Stenzel, O.
Journal
Applied optics  
DOI
10.1364/AO.55.006983
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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