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A dedicated illumination for full-field X-ray microscopy with multilayer Laue lenses

 
: Niese, Sven; Braun, Stefan; Dietsch, Reiner; Gluch, Jürgen; Holz, Thomas; Huber, Norman; Kubec, Adam; Zschech, Ehrenfried

:

Thieme, J.:
ICXOM 2015, 23rd International Congress on X-ray Optics and Microanalysis : 14-18 September 2015, Upton, New York, USA
Woodbury, N.Y.: AIP, 2016 (AIP Conference Proceedings 1764)
ISBN: 978-0-7354-1422-8
Art. 020002, 7 pp.
International Congress on X-Ray Optics and Microanalysis (ICXOM) <23, 2015, Upton/NY>
Bundesministerium für Bildung und Forschung BMBF
IKT 2020 - Forschung für Innovation; 16ES0070; Master 3D
English
Conference Paper
Fraunhofer IWS ()
Fraunhofer IKTS ()
dedicated illumination; full-field X-ray microscopy

Abstract
We present a concept of a dedicated illumination to perform full-field X-ray microscopy with multilayer Laue lenses at laboratory X-ray sources. The basic idea is the application of a focusing X-ray multilayer mirror as condenser optics to provide a quasi-monochromatic and solid illumination, and consequently optimal conditions for the operation of the multilayer Laue lenses. First experimental results demonstrate the proof of this concept.

: http://publica.fraunhofer.de/documents/N-415136.html