Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Fast hierarchical multi-level fault simulation of sequential circuits with switch-level accurancy

 
: Meyer, W.; Camposano, R.

Association for Computing Machinery -ACM-; Institute of Electrical and Electronics Engineers -IEEE-:
30th Design Automation Conference 1993. Proceedings : June 14 - 18, 1993, Dallas, Texas
New York: ACM Press, 1993
ISBN: 0-89791-577-1
ISBN: 0-7803-1331-3
ISBN: 07803-1333-X
ISSN: 0738-100X
pp.515-519
Design Automation Conference <30, 1993, Dallas, Tex.>
English
Conference Paper
Fraunhofer GMD
fault-modeling; test; switch-level

: http://publica.fraunhofer.de/documents/N-41383.html