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Effects of board design parameters on failure mechanisms of PCB/BGA assemblies under drop impact

 
: Tsebo Simo, G.L.; Shirangi, H.; Nowottnick, M.; Rzepka, S.

:

Institute of Electrical and Electronics Engineers -IEEE-; IEEE Components, Packaging, and Manufacturing Technology Society:
IEEE 65th Electronic Components and Technology Conference, ECTC 2015. Vol.3 : San Diego, California, USA, 26 - 29 May 2015
Piscataway, NJ: IEEE, 2015
ISBN: 978-1-4799-8610-1
ISBN: 978-1-4799-8609-5
pp.2048-2053
Electronic Components and Technology Conference (ECTC) <65, 2015, San Diego/Calif.>
English
Conference Paper
Fraunhofer ENAS ()

Abstract
The dependency of the failure mechanisms of PCB/BGA assemblies subjected to drop impact on board designs variations is investigated in this study. Two key parameters are considered: the copper pad size and the trace routing. It is shown that the assemblies can exhibit various failure modes such as copper trace crack, pad cratering on PCB or crack at interposer on package side by varying these board design parameters, due to stress/strain redistribution in assembly, as well as the location change of the weakest link. The tradeoff between these failure modes during the design change is also investigated. With the help of finite element simulations, reliable failure indicators for each possible failure mode can be defined. With all these indicators considered, it is therefore possible to establish rules for predicting the failure behavior and the lifetime of PCB/BGA assemblies subjected to drop impacts, depending on the board layout.

: http://publica.fraunhofer.de/documents/N-383225.html