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HREM and EELS analysis of fullerene-like carbon films

 

Kiely, C.J. ; Institute of Physics -IOP-, Electron Microscopy and Analysis Group:
Electron microscopy and analysis 1999 : Proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24 - 27 August 1999
Bristol: IOP Publishing, 1999 (Institute of Physics - Conference Series 161)
ISBN: 0-7503-0577-0
pp.369-372
Institute of Physics, Electron Microscopy and Analysis Group (Conference) <1999, Sheffield>
English
Conference Paper
Fraunhofer IWS ()

: http://publica.fraunhofer.de/documents/N-37917.html