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Photoluminescence-based current-voltage characterisation of individual subcells in multi-junction devices
We demonstrate a photoluminescence based, contactless method to determine the current-voltage characteristics of the individual subcells in a multi-junction solar cell. The method, furthers known results for single junction devices and relies upon the reciprocity relation between the absorption and emission properties on a solar cell. Laser light with a suitable energy is used to excite carriers selectively in one junction and the internal voltages are deduced from the intensity of the resulting luminescence. The IV curves obtained this way on 1J, 2J and 6J devices are compared to those obtained using electroluminescence. Good agreement is obtained at high injection conditions while discrepancies at low injection are attributed to in-plane carrier transport.