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A sparse array based sub-terahertz imaging system for volume inspection

 
: Baccouche, Bessem; Keil, A.; Kahl, M.; Haring Bolivar, P.; Loeffler, T.; Jonuscheit, Joachim; Friederich, Fabian

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45th European Microwave Conference, EuMC 2015. Proceedings : 7-10 September 2015, Paris, France
London: Horizon House, 2015
ISBN: 978-2-8748-7039-2
pp.438-441
European Microwave Conference (EuMC) <45, 2015, Paris>
English
Conference Paper
Fraunhofer IPM ()
nondestructive testing; terahertz wave imaging; millimetre wave imaging

Abstract
Imaging systems operating in the sub-terahertz frequency range have proven to be highly attractive devices for non-destructive testing applications. Especially frequency modulated system concepts have shown a great potential for volume inspection in industrial process and quality control, but often lack fast image acquisition times. We report on the development of a line array system for fast sub-terahertz imaging applications. The realized system employs a sparse array consisting of 12 emitters and 12 heterodyne receivers and operates in the W frequency band between 75 GHz and 110 GHz. The applied stepped-frequency continuous-wave radar concept provides 35 GHz modulation bandwidth for fast volume inspections of large test objects in combination with a band-conveyor.

: http://publica.fraunhofer.de/documents/N-378984.html