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An evolutionary algorithm based approach to improve the limits of minimum thickness measurements of multilayered automotive paints

 
: Krimi, Soufiene; Klier, Jens; Ellrich, Frank; Jonuscheit, Joachim; Urbansky, R.; Beigang, René; Freymann, Georg von

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Institute of Electrical and Electronics Engineers -IEEE-:
40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015. Vol.2 : Hong Kong, China, 23 - 28 August 2015
Piscataway, NJ: IEEE, 2015
ISBN: 978-1-4799-8273-8
ISBN: 978-1-4799-8272-1
pp.739
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) <40, 2015, Hong Kong>
English
Conference Paper
Fraunhofer IPM ()

Abstract
We present a novel numerical approach to decrease the limits of the minimum paint thickness measurements of individual layers in multilayered structures using terahertz pulsed technique in reflection geometry. This method combines the benefits of model-based material parameters extraction, a generalized transfer matrix method, and an evolutionary optimization algorithm. The proposed approach has been successfully applied to resolve individual layer thicknesses down to 5 μm in multilayered automotive paint samples.

: http://publica.fraunhofer.de/documents/N-378981.html