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Applications of synchrotron radiation x-ray techniques on the analysis of the behavior of transition metals in solar cells and single-crystalline silicon with extended defects

 

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Bonde Nielsen, K.:
22nd International Conference on Defects in Semiconductors 2003. Proceedings : Held in Aarhus, Denmark 28 July - 1 August 2003
Amsterdam: Elsevier, 2004 (Physica: B, Condensed matter 340/342.2003)
pp.1137-1141
International Conference on Defects in Semiconductors (ICDS) <22, 2003, Aarhus>
English
Conference Paper, Journal Article
Fraunhofer ISE ()

: http://publica.fraunhofer.de/documents/N-37845.html