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Behavioral EMI models of complex digital VLSI circuits

 
: Steinecke, T.; Koehne, H.; Schmidt, M.

:

Microelectronics journal 35 (2004), No.6, pp.547-555
ISSN: 0026-2692
ISSN: 0959-8324
English
Journal Article
Fraunhofer IZM ()

Abstract
Increasing EMI potential of high-performance digital circuits like 32bit microcontrollers demand for switching current models and feasible ways to run netlist-based EMI simulations. A promising modeling approach for digital VLSI circuits is presented and a silicon test vehicle for correlation between models and measurements is described.

: http://publica.fraunhofer.de/documents/N-37665.html