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High-resolution material and surface topography characterization by a modified low-coherence interferometer

 
: Taudt, Christopher; Baselt, Tobias; Nelsen, Bryan; Koch, Edmund; Hartmann, Peter

:
Poster urn:nbn:de:0011-n-3705935 (10 MByte PDF)
MD5 Fingerprint: 8e18cdfe136e198049864eb4c3156db4
Created on: 23.12.2015


2015, 1 pp.
International Summer School "New Frontiers in Optical Technologies" <8, 2015, Tampere>
Bundesministerium für Bildung und Forschung BMBF
16ES0233; ENIAC
English
Poster, Electronic Publication
Fraunhofer IWS ()

: http://publica.fraunhofer.de/documents/N-370593.html