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Thermo-mechanical analysis of advanced electronic packages in early system design

 
: Sommer, J.-P.; Wittler, O.; Manessis, D.; Michel, B.

:

Microsystem Technologies 12 (2005), No.1-2, pp.75-81
ISSN: 0946-7076
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) <2004, Montreux>
English
Journal Article, Conference Paper
Fraunhofer IZM ()

Abstract
The thermal and thermo-mechanical behaviour of advanced electronic packages should be taken into account from the initial design phase in order to achieve a high level of reliability. Numerical studies by means of finite element (FE) analyses are very useful in order to reveal and evaluate the essential thermal and mechanical influences which are induced during manufacturing, storing, transport, and operation. Two different types of packages are under investigation, an RF-system on chip including digital and analogue parts on one chip (RF SoC), and combined in a BGA-type package, made by Shellcase Ltd, and a power transistor with all contacts on one side. Parametric FE analyses are presented in order to pre-optimise the shape of the interconnects and to improve the compliance between stiff components before prototyping and real testing.

: http://publica.fraunhofer.de/documents/N-36142.html