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An emperical method for imaging the short circuit current density in silicon solar cells based on dark lock-in thermography

: Breitenstein, O.; Fertig, F.; Bauer, J.


Solar energy materials and solar cells 143 (2015), pp.406-410
ISSN: 0927-0248
Journal Article
Fraunhofer ISE ()
PV Produktionstechnologie und Qualitätssicherung; Silicium-Photovoltaik; Messtechnik und Produktionskontrolle

The most straightforward way to map the photo-induced short circuit current density (Jsc) in solar cells is light beam-induced current (LBIC) mapping. Recently several methods for Jsc imaging based on camera-based photoluminescence and illuminated lock-in thermography imaging were proposed. This letter reports an alternative method for Jsc imaging, which is solely based on the evaluation of dark lock-in thermography images. This method is particularly advantageous to improve the accuracy of dark lock-in thermography based local efficiency analysis of solar cells.