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Batch screening of commercial serial flash-memory integrated circuits for low-temperature applications

: Ihmig, F.R.; Shirley, S.G.; Zimmermann, H.

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Cyrogenics 71 (2015), pp.39-46
ISSN: 0011-2275
Journal Article, Electronic Publication
Fraunhofer IBMT ()

We present comprehensive results on the experimentally measured performance of commercial serial flash-memory integrated circuits (ICs) over a wide temperature range (-196°C to 25°C). We also address endurance issues because our intended low-temperature application is electronics related to long-term storage of biological material. We compared six batches of flash-memory ICs, manufactured between 2007 and 2012. Test results reveal a batch-to-batch variation of the pass rate. Typically, programming times increase by a factor of 4-6 at -196°C. The practical relevance of our results is discussed.