
Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Batch screening of commercial serial flash-memory integrated circuits for low-temperature applications
| Cyrogenics 71 (2015), pp.39-46 ISSN: 0011-2275 |
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| English |
| Journal Article, Electronic Publication |
| Fraunhofer IBMT () |
Abstract
We present comprehensive results on the experimentally measured performance of commercial serial flash-memory integrated circuits (ICs) over a wide temperature range (-196°C to 25°C). We also address endurance issues because our intended low-temperature application is electronics related to long-term storage of biological material. We compared six batches of flash-memory ICs, manufactured between 2007 and 2012. Test results reveal a batch-to-batch variation of the pass rate. Typically, programming times increase by a factor of 4-6 at -196°C. The practical relevance of our results is discussed.