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Optical effects at projection measurements for Terahertz tomography

 
: Brahm, A.; Merx, S.; Tymoshchuk, M.; Notni, G.; Tünnermann, A.

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Institute of Electrical and Electronics Engineers -IEEE-:
39th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2014. Proceedings. Vol.1 : September 14-19, 2014, The University of Arizona, Tucson, AZ
Piscataway, NJ: IEEE, 2014
ISBN: 978-1-4799-3877-3
ISBN: 978-1-4799-3878-0
pp.423-424
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) <39, 2014, Tucson/Ariz.>
English
Conference Paper
Fraunhofer IOF ()

Abstract
Optical aberrations like refraction, diffraction and edge effects have an influence on Terahertz measurements. They can produce image artifacts which make it difficult to detect and resolve material defects inside the samples. We used a geometrical optical ray tracing approach to analyze the optical effects at Terahertz projection measurements which can be used to perform 2D or 3D THz images. We measured plastic samples with different shapes and compared them to simulations which are realized with the software ZEMAX. Furthermore, different methods to overcome the impact of edge effects will be introduced.

: http://publica.fraunhofer.de/documents/N-351024.html