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Influence of bilayer resist processing on p-i-n OLEDs: Towards multicolor photolithographic structuring of organic displays

 
: Krotkus, Simonas; Nehm, Frederik; Kasemann, Daniel; Hofmann, Simone; Leo, Karl; Reineke, Sebastian; Janneck, Robby; Kalkura, Shrujan; Zakhidov, Alex A.; Schober, Matthias; Hild, Olaf R.

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Tabor, C.E. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Organic Photonic Materials and Devices XVII : 9-11 February 2015, San Francisco, California
Bellingham, WA: SPIE, 2015 (Proceedings of SPIE 9360)
ISBN: 9781628414509
Paper 93600W, 10 pp.
Conference "Organic Photonic Materials and Devices" <17, 2015, San Francisco/Calif.>
English
Conference Paper
Fraunhofer FEP ()
OLED; organic; display

Abstract
Recently, bilayer resist processing combined with development in hydrofluoroether (HFE) solvents has been shown to enable single color structuring of vacuum-deposited state-of-the-art organic light-emitting diodes (OLED). In this work, we focus on further steps required to achieve multicolor structuring of p-i-n OLEDs using a bilayer resist approach. We show that the green phosphorescent OLED stack is undamaged after lift-off in HFEs, which is a necessary step in order to achieve RGB pixel array structured by means of photolithography. Furthermore, we investigate the influence of both, double resist processing on red OLEDs and exposure of the devices to ambient conditions, on the basis of the electrical, optical and lifetime parameters of the devices. Additionally, water vapor transmission rates of single and bilayer system are evaluated with thin Ca film conductance test. We conclude that diffusion of propylene glycol methyl ether acetate (PGMEA) through the fluoropolymerfilm is the main mechanism behind OLED degradation observed after bilayer processing.

: http://publica.fraunhofer.de/documents/N-343695.html