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Advanced lifetime spectroscopy: Unambiguous determination of the electronic properties of the metastable defect in boron-doped Cz-Si

 
: Rein, S.; Lichtner, P.; Glunz, S.W.

:
Fulltext urn:nbn:de:0011-n-342109 (109 KByte PDF)
MD5 Fingerprint: 5e7a276a391a2ff8d69c3b13edae1789
Created on: 26.10.2012


Kurokawa, K. ; Institute of Electrical and Electronics Engineers -IEEE-:
3rd World Conference on Photovoltaic Energy Conversion 2003. Proceedings. Vol.B : Joint conference of 13th PV Science & Engineering Conference, 30th IEEE PV Specialists Conference, 18th European PV Solar Energy Conference ; Osaka International Congress Center "Grand Cube", Osaka, Japan, 11 - 18 May 2003
Osaka, 2003
ISBN: 4-9901816-1-1
pp.1057-1060
World Conference on Photovoltaic Energy Conversion (WCPEC) <3, 2003, Osaka>
PV Science and Engineering Conference <13, 2003, Osaka>
PV Specialists Conference <30, 2003, Osaka>
European PV Solar Energy Conference <18, 2003, Osaka>
English
Conference Paper, Electronic Publication
Fraunhofer ISE ()

Abstract
By combining data from temperature- and injectiondependent lifetime spectroscopy (TDLS and IDLS) measured by means of the microwave-detected photoconductance decay technique and the quasi-steady state photoconductance technique, respectively, the exact electronic structure of the metastable defect in standard boron-doped Czochralski (Cz) silicon has been determined. A detailed Shockley-Read-Hall analysis of the entire TDLS curve reveals that the Cz-specific defect acts as an attractive Coulomb center (sigma(ind n)(T)) = sigma(ind n0) T(exp -2)) which is localized in the upper band gap half at E(ind C)-E(ind t) = 0.41 eV and has an electron/hole capture cross section ratio k:= sigma(ind n)/ sigma(ind p) of 9.3. A new routine for data evaluation allows a transparent SRH analysis of IDLS and TDLS data and enables the accuracy and consistency of the determined defect parameters to be assessed. For the metastable defect in boron-doped Cz-Si perfect agreement between IDLS and TDLS has been found, which demonstrates the excellent performance of lifetime spectroscopy.

: http://publica.fraunhofer.de/documents/N-34210.html