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In-situ investigations of individual nanowires within a FIB/SEM system

 
: Löffler, Markus; Banerjee, Sayanti; Trommer, Jens; Heinzig, André; Weber, Walter; Zschech, Ehrenfried

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Microscopy and microanalysis 20 (2014), Supplement S3, pp.360-361
ISSN: 1431-9276
Microscopy & Microanalysis Annual Meeting (M&M) <2014, Hartford/Conn.>
English
Journal Article, Conference Paper
Fraunhofer IKTS ()

: http://publica.fraunhofer.de/documents/N-337610.html