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1981
Journal Article
Titel
Performance of a scaled Si gate n-well CMOS technology
Abstract
A scaled n-well CMOS technology with 40 nm gate oxide, 1 µm PMOS and 2 µm NMOS transistors has been realised with peak effective mobilities of 710 and 260 cm2V-1s-1 for electrons and holes, respectively, and available voltage gains as high as 80 for a 1 µm PMOS and 115 for a 2 µm NMOS transistor. The corresponding maximum inverter gain was 75. The inverter supply voltage range was 1.5 to 12 V and the inverter delay time was 300 ps at 5 V supply voltage.
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