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RBS analysis of AlGaSb thin films

 
: Barradas, N.P.; Alves, E.; Ruiz, C.M.; Dieguez, E.; Dimroth, F.; Chenot, M.-A.; Bett, A.

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Vízkelethy, G.:
Ion beam analysis. Proceedings of the Sixteenth International Conference on Ion Beam Analysis 2003 : Albuquerque, NM, USA, 29 June - 4 July 2003
Amsterdam: Elsevier, 2004 (Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms 219/220.2004)
pp.928-932
International Conference on Ion Beam Analysis (IBA) <16, 2003, Albuquerque, NM>
English
Conference Paper, Journal Article
Fraunhofer ISE ()
Epitaxie; Epitaxie MOVPE

: http://publica.fraunhofer.de/documents/N-33308.html