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Extended event-driven modeling of a ΣΔ-fractional-N PLL including non-ideal effects

 
: Hangmann, C.; Hedayat, C.; Hilleringmann, U.

:

Institute of Electrical and Electronics Engineers -IEEE-; IEEE Circuits and Systems Society:
21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014 : 7-10 December 2014, Marseille, France
Piscataway, NJ: IEEE, 2014
ISBN: 978-1-4799-4242-8
ISBN: 978-1-4799-4241-1
pp.100-103
International Conference on Electronics, Circuits and Systems (ICECS) <21, 2014, Marseille>
English
Conference Paper
Fraunhofer ENAS ()

Abstract
In modern systems PLLs are widely used e.g. for frequency synthesis. Since this feedback control system exhibits a mixed-signal nature, it is challenging to use general theory to characterize its dynamic behavior. Additionally, due to the low and high frequency parts, simulations utilizing either a behavioral or transistor-level model are not computer resource efficient. To overcome this the modular and enhanced Event-Driven Model can be used. Since the existing Event-Driven Model is neither applicable to take different divider delays into account nor to consider a ΣΔ-Modulator, this work focuses on the extension of this modeling approach considering a ΣΔ-Fractional-N PLL with non-ideal effects like dead zone, leakage current and different divider delays. This extended model is validated with transistor-level simulations and is used to explore the impact of non-ideal effects on the loop characteristics.

: http://publica.fraunhofer.de/documents/N-328301.html