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Modeling and characterization of CP-PLL phase noise in presence of dead zone

: Hangmann, C.; Wüllner, I.; Hedayat, C.; Hilleringmann, U.


Institute of Electrical and Electronics Engineers -IEEE-; IEEE Circuits and Systems Society:
IEEE 12th International New Circuits and Systems Conference, NEWCAS 2014 : Trois-Rivières, Quebec, Canada, 22 - 25 June 2014
Piscataway, NJ: IEEE, 2014
ISBN: 978-1-4799-7869-4
ISBN: 978-1-4799-4885-7
International New Circuits and Systems Conference (NEWCAS) <12, 2014, Quebec>
Conference Paper
Fraunhofer ENAS ()

The analysis of non-linear mixed-signal systems like CP-PLLs is challenging because general theory of control systems cannot be applied easily. Therefore, CP-PLLs are designed within simulation platforms describing them on transistor-, behavioral-or linear-level. These models are often unprofitable according to the characterization capability, simulation time and computer resources when considering non-ideal effects. To avoid this, the modular and enhanced event-driven model can be used. Since this model is not applicable to combine phase noise and non-ideal effects, this paper focuses on modeling phase noise within the event-driven representation. Furthermore, an analytical description of the impact of dead zone on phase noise is given to obtain an optimized and robust system design.