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High-resolution optical and electro-optical microscopy for PV-modules

 
: Grosser, S.; Gläser, M.; Brzuska, C.; Tänzer, T.; Schippel, F.; Hagendorf, C.

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Fulltext (PDF; )

Energy Procedia 55 (2014), pp.451-455
ISSN: 1876-6102
International Conference on Crystalline Silicon Photovoltaics (SiliconPV) <4, 2014, S'Hertogenbosch>
English
Conference Paper, Journal Article, Electronic Publication
Fraunhofer CSP ()

Abstract
Non-destructive methods for high-resolution inspection are of great importance for quality assurance, reliability assessment and for research and development. Especially for samples like solar modules or large specimens high-resolution microscopy measurements are not used and therefore observable details are strongly limited by the optical resolution. Small defects can grow and cause a reduction of the module's lifetime. A portal-based inspection system has been set up for large samples like a PV-module or any other large sample. It can be equipped with several optical systems like cameras or a microscope. The optical properties are optimized for visual or for electroluminescence imaging on a macroscopic and microscopic scale and complements an existing Dark Lock-In Thermography (DLIT) setup for modules. The inspection system has been exemplarily used on two samples with defects and degradations to elucidate the wide range of applications. An investigation on a module with snail trail discolorations has been conducted. Cell cracks, finger interruptions and finger discoloration are measured using light microscopy and micro-electroluminescence imaging (mu-EL). Cracks within EL-inactive cell parts could be revealed only with light microscopy. On another sample the correlation on a microscopic scale of visible cell cracks, local delamination and the corresponding micro-electroluminescence (mu-EL) will be demonstrated. The correlation of light microscopy, mu-EL and DLIT illustrates the potential of a high-resolution module inspection for quality control, reliability assessment and for research and development.

: http://publica.fraunhofer.de/documents/N-324392.html