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Preliminary Temperature Accelerated Life Test (ALT) On Lattice Mismatched Triple-Junction Concentrator

: Orlando, V.; Espinet, P.; Nunez, N.; Contreras, Y.; Bautista, J.; Vázquez, M.; Algora, C.; Eltermann, F.; Bett, A.W.


Kinsey , G.S.; Riley, D.; Kurtz, S.; Araki, K.; Baudrit, M.:
10th International Conference on Concentrator Photovoltaic Systems, CPV-10 : 7–9 April 2014, Albuquerque
Woodbury, N.Y.: AIP, 2014 (AIP Conference Proceedings 1616)
ISBN: 978-0-7354-1253-8
International Conference on Concentrator Photovoltaic Systems (CPV) <10, 2014, Albuquerque/NM>
Conference Paper
Fraunhofer ISE ()
Materialien - Solarzellen und Technologie; III-V und Konzentrator-Photovoltaik; III-V Epitaxie und Solarzellen

A temperature accelerated life test on concentrator lattice mismatched Ga0.37In0.63P/Ga0.83In0.17As/Ge triple-junction solar cells-on-carrier is being carried out. The solar cells have been tested at three different temperatures: 125, 145 and 165°C and the nominal photo-current condition (500X) is emulated by injecting current in darkness. The final objective of these tests is to evaluate the reliability, warranty period, and failure mechanism of these solar cells in a moderate period of time. Up to now only the test at 165°C has finished. Therefore, we cannot provide complete reliability information, but we have carried out preliminary data and failure analysis with the current results.