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Polarization-Resolved Near-Field Mapping of Plasmonic Aperture Emission by a Dual-SNOM System

: Klein, Angela E.; Janunts, Norik; Steinert, Michael; Tünnermann, Andreas; Pertsch, Thomas


Nano Letters 14 (2014), No.9, pp.5010–5015
ISSN: 1530-6984
ISSN: 1530-6992
Journal Article
Fraunhofer IOF ()
near-field optical microscopy; dipole; plasmonics; scanning probe microscopy

We study the polarization characteristics of light emission and collection in the near field by the tips of a Dual-SNOM (two scanning near-field optical microscopes) setup. We find that cantilevered fiber probes can serve as emitters of polarized light, or as polarization-sensitive detectors. The polarization characteristics depend on the fiber type used for tip fabrication. In Dual-SNOM measurements, we demonstrate mapping of different field components of the plasmonic dipole pattern emitted by an aperture probe.