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Ultra broadband phase measurements on nanostructured metasurfaces

: Pshenay-Severin, E.; Falkner, M.; Helgert, C.; Pertsch, Thomas


Applied Physics Letters 104 (2014), No.22, Art. 221906, 6 pp.
ISSN: 0003-6951
ISSN: 1077-3118
Journal Article
Fraunhofer IOF ()
dispersive optical materials; experimental techniques; indirect methods; interferometric methods; Kramers-Kronig transformation; Nanostructured; ultra-broadband; versatile tools

We report on an interferometric method developed for ultra broadband (from lambda=0.65µm to lambda=1.7µm) phase measurements on metasurfaces in transmission and reflection. Due to a unique performance of our method in terms of the accessible spectral range, accuracy (±0.02 rad), and flexibility with respect to the sample arrangement, this technique can be broadly used as a versatile tool for the comprehensive characterization of a broad class of dispersive optical materials. We compare our experimental technique with an indirect approach and based on the Kramers-Kronig transformation analysis, establish a rule for the use of the indirect method.