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Rapid permeation measurement system for the production control of monolayer and multilayer films

: Botos, J.; Müller, K.; Heidemeyer, P.; Kretschmer, K.; Bastian, M.; Hochrein, T.


Altstädt, V. ; American Institute of Physics -AIP-, New York:
29th International Conference of the Polymer Processing Society, PPS 2013. Proceedings : 15–19 July 2013, Nuremberg, Germany
New York, N.Y.: AIP Press, 2014 (AIP Conference Proceedings 1593)
ISBN: 978-0-7354-1227-9
Polymer Processing Society (PPS International Conference) <29, 2013, Nuremberg>
Conference Paper
Fraunhofer IVV ()

Plastics have been used for packaging films for a long time. Until now the development of new formulations for film applications, including process optimization, has been a time-consuming and cost-intensive process for gases like oxygen (O2) or carbon dioxide (CO2). By using helium (He) the permeation measurement can be accelerated from hours or days to a few minutes. Therefore a manometric measuring system for tests according to ISO 15105-1 is coupled with a mass spectrometer to determine the helium flow rate and to calculate the helium permeation rate. Due to the accelerated determination the permeation quality of monolayer and multilayer films can be measured at line. Such a system can be used to predict for example the helium permeation rate of filled polymer films. Defined quality limits for the permeation rate can be specified as well as the prompt correction of process parameters if the results do not meet the specification. This method for process control was tested on a pilot line with a corotating twin-screw extruder for monolayer films. Selected process parameters were varied iteratively without changing the material formulation to obtain the best process parameter set and thus the lowest permeation rate. Beyond that the influence of different parameters on the helium permeation rate was examined on monolayer films. The results were evaluated conventional as well as with artificial neuronal networks in order to determine the non-linear correlation between all process parameters.