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Use of twin wavelength x-ray monitoring system for process control of EB evaporation of alloys

 
: Schiller, N.

Bakish, R. ; Bakish Materials Corp., Englewood/N.J.:
Electron Beam Melting and Refining - State of the Art 1993. Proceedings of the Conference : Reno, Nevada, November 3 - 5, 1993
Englewood, NJ, 1993
pp.81-94
Conference on Electron Beam Melting and Refining <10, 1993, Reno/Nev.>
English
Conference Paper
Fraunhofer FEP ()

: http://publica.fraunhofer.de/documents/N-30190.html