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X-ray analytical composition monitoring using the TXM system

 
: Schiller, N.

Bakish, R. ; Bakish Materials Corp., Englewood/N.J.:
Electron Beam Melting and Refining - State of the Art 1992. Proceedings of the Conference : Reno, Nevada, October 25 - 27, 1992
Englewood, NJ, 1992
pp.51-59
Conference on Electron Beam Melting and Refining <1992, Reno/Nev.>
English
Conference Paper
Fraunhofer FEP ()

: http://publica.fraunhofer.de/documents/N-30188.html