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Investigation on the impact of macro- and micro-climate on the potential induced degradation

 
: Hoffmann, S.; Köhl, M.

:

Institute of Electrical and Electronics Engineers -IEEE-; IEEE Electron Devices Society; Institute of Electrical and Electronics Engineers -IEEE-, Power & Energy Society -PES-:
39th IEEE Photovoltaic Specialists Conference, PVSC 2013 : Tampa, Florida, USA, 16.06.2013-21.06.2013
Piscataway, NJ: IEEE, 2013
ISBN: 978-1-4799-3299-3
pp.1822-1825
Photovoltaic Specialists Conference (PVSC) <39, 2013, Tampa/Fla.>
English
Conference Paper
Fraunhofer ISE ()
photovoltaisches Modul; Systeme und Zuverlässigkeit; Photovoltaische Module und Kraftwerke; Gebrauchsdauer von Modulen und Materialien; Gebrauchsdaueranalyse und Umweltsimulation; PID; test; testing

Abstract
The climatic conditions play an important role for a degradation mechanism of photovoltaic modules, known as potential induced degradation (PID). The influence of ambient humidity, precipitation and temperature on the leakage current has been investigated with high voltage stress in two different climate regions. This work focusses on one of them (Freiburg, Germany) It was found out, that for this test sit, rain seems to be a serious problem as a conductive layer is established that leads to a high leakage current. A temperature dependency such as found in indoor test was found as well.

: http://publica.fraunhofer.de/documents/N-290806.html